%0 Conference Paper %1 conf/aspdac/OhtakeNWF01 %A Ohtake, Satoshi %A Nagai, Shintaro %A Wada, Hiroki %A Fujiwara, Hideo %B ASP-DAC %D 2001 %E Goto, Satoshi %I ACM %K dblp %P 331-334 %T A DFT method for RTL circuits to achieve complete fault efficiency based on fixed-control testability. %U http://dblp.uni-trier.de/db/conf/aspdac/aspdac2001.html#OhtakeNWF01 %@ 0-7803-6634-4

@inproceedings{conf/aspdac/OhtakeNWF01, added-at = {2018-11-06T00:00:00.000+0100}, author = {Ohtake, Satoshi and Nagai, Shintaro and Wada, Hiroki and Fujiwara, Hideo}, biburl = {https://www.bibsonomy.org/bibtex/2e434d196af954c6579371831ac9ec0c9/dblp}, booktitle = {ASP-DAC}, crossref = {conf/aspdac/2001}, editor = {Goto, Satoshi}, ee = {https://doi.org/10.1145/370155.370371}, interhash = {31d5fc11c65f08a8e9f21d64273f03d0}, intrahash = {e434d196af954c6579371831ac9ec0c9}, isbn = {0-7803-6634-4}, keywords = {dblp}, pages = {331-334}, publisher = {ACM}, timestamp = {2019-10-17T16:43:55.000+0200}, title = {A DFT method for RTL circuits to achieve complete fault efficiency based on fixed-control testability.}, url = {http://dblp.uni-trier.de/db/conf/aspdac/aspdac2001.html#OhtakeNWF01}, year = 2001 }