%0 Conference Paper %1 conf/cicc/KerP98 %A Ker, Ming-Dou %A Peng, Jeng-Jie %B CICC %D 1998 %I IEEE %K dblp %P 537-540 %T Layout design and verification for cell library to improve ESD/latchup reliability in deep-submicron CMOS technology. %U http://dblp.uni-trier.de/db/conf/cicc/cicc1998.html#KerP98 %@ 0-7803-4292-5

@inproceedings{conf/cicc/KerP98, added-at = {2023-07-07T00:00:00.000+0200}, author = {Ker, Ming-Dou and Peng, Jeng-Jie}, biburl = {https://www.bibsonomy.org/bibtex/209096a45f7de4c986725fd614dd5bbfa/dblp}, booktitle = {CICC}, crossref = {conf/cicc/1998}, ee = {https://doi.org/10.1109/CICC.1998.695035}, interhash = {3214b79e12cc4177938a9fff436f55a8}, intrahash = {09096a45f7de4c986725fd614dd5bbfa}, isbn = {0-7803-4292-5}, keywords = {dblp}, pages = {537-540}, publisher = {IEEE}, timestamp = {2024-04-09T19:39:24.000+0200}, title = {Layout design and verification for cell library to improve ESD/latchup reliability in deep-submicron CMOS technology.}, url = {http://dblp.uni-trier.de/db/conf/cicc/cicc1998.html#KerP98}, year = 1998 }