%0 Conference Paper %1 conf/vlsit/WuHSFAHSCCLYQYL23 %A Wu, Wen-Chia %A Hung, Terry Y. T. %A Sathaiya, D. Mahaveer %A Fan, Dongxu %A Arutchelvan, Goutham %A Hsu, Chen-Feng %A Su, Sheng-Kai %A Chou, Ang-Sheng %A Chen, Edward %A Li, Weisheng %A Yu, Zhihao %A Qiu, Hao %A Yang, Ying-Mei %A Lin, Kuang-I %A Shen, Yun-Yang %A Chang, Wen-Hao %A Liew, San Lin %A Hou, Vincent D.-H. %A Cai, Jin %A Wu, Chung-Cheng %A Wu, Jeff %A Wong, H.-S. Philip %A Wang, Xinran %A Chien, Chao-Hsin %A Cheng, Chao-Ching %A Radu, Iuliana P. %B VLSI Technology and Circuits %D 2023 %I IEEE %K dblp %P 1-2 %T Scaled contact length with low contact resistance in monolayer 2D channel transistors. %U http://dblp.uni-trier.de/db/conf/vlsit/vlsit2023.html#WuHSFAHSCCLYQYL23 %@ 978-4-86348-806-9

@inproceedings{conf/vlsit/WuHSFAHSCCLYQYL23, added-at = {2023-08-03T00:00:00.000+0200}, author = {Wu, Wen-Chia and Hung, Terry Y. T. and Sathaiya, D. Mahaveer and Fan, Dongxu and Arutchelvan, Goutham and Hsu, Chen-Feng and Su, Sheng-Kai and Chou, Ang-Sheng and Chen, Edward and Li, Weisheng and Yu, Zhihao and Qiu, Hao and Yang, Ying-Mei and Lin, Kuang-I and Shen, Yun-Yang and Chang, Wen-Hao and Liew, San Lin and Hou, Vincent D.-H. and Cai, Jin and Wu, Chung-Cheng and Wu, Jeff and Wong, H.-S. Philip and Wang, Xinran and Chien, Chao-Hsin and Cheng, Chao-Ching and Radu, Iuliana P.}, biburl = {https://www.bibsonomy.org/bibtex/2b8ae63316e63af2f947d7671dbbf8e9a/dblp}, booktitle = {VLSI Technology and Circuits}, crossref = {conf/vlsit/2023}, ee = {https://doi.org/10.23919/VLSITechnologyandCir57934.2023.10185408}, interhash = {33f3fc3be517c5e93f187681816a56a3}, intrahash = {b8ae63316e63af2f947d7671dbbf8e9a}, isbn = {978-4-86348-806-9}, keywords = {dblp}, pages = {1-2}, publisher = {IEEE}, timestamp = {2024-04-09T19:13:01.000+0200}, title = {Scaled contact length with low contact resistance in monolayer 2D channel transistors.}, url = {http://dblp.uni-trier.de/db/conf/vlsit/vlsit2023.html#WuHSFAHSCCLYQYL23}, year = 2023 }