%0 Conference Paper %1 conf/wts/KhooHH09 %A Khoo, Benjamin %A Harris, Peter %A Husain, Syed Abbas %B WTS %D 2009 %I IEEE %K dblp %P 1-7 %T Security risk analysis of RFID technology: A RFID tag life cycle approach. %U http://dblp.uni-trier.de/db/conf/wts/wts2009.html#KhooHH09 %@ 978-1-4244-2589-1

@inproceedings{conf/wts/KhooHH09, added-at = {2015-03-27T00:00:00.000+0100}, author = {Khoo, Benjamin and Harris, Peter and Husain, Syed Abbas}, biburl = {https://www.bibsonomy.org/bibtex/24481f864cc1afba60268cc326fba9b96/dblp}, booktitle = {WTS}, crossref = {conf/wts/2009}, ee = {http://dx.doi.org/10.1109/WTS.2009.5068991}, interhash = {349f2e6442bc8f9d266f01050192f383}, intrahash = {4481f864cc1afba60268cc326fba9b96}, isbn = {978-1-4244-2589-1}, keywords = {dblp}, pages = {1-7}, publisher = {IEEE}, timestamp = {2015-06-18T23:55:45.000+0200}, title = {Security risk analysis of RFID technology: A RFID tag life cycle approach.}, url = {http://dblp.uni-trier.de/db/conf/wts/wts2009.html#KhooHH09}, year = 2009 }