Inproceedings,
Embedded deterministic test points for compact cell-aware tests.
C. Acero, D. Feltham, F. Hapke, E. Moghaddam, N. Mukherjee, V. Neerkundar, M. Patyra, J. Rajski, J. Tyszer, and J. Zawada.ITC, page 1-8. IEEE, (2015)
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- ITC
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- 2015
- pages
- 1-8
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- IEEE
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- conf/itc/2015
- ee
- https://doi.org/10.1109/TEST.2015.7342383
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- 978-1-4673-6578-9
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- http://dblp.uni-trier.de/db/conf/itc/itc2015.html#AceroFHMMNPRTZ15
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%1 conf/itc/AceroFHMMNPRTZ15
%A Acero, Cesar
%A Feltham, Derek
%A Hapke, Friedrich
%A Moghaddam, Elham K.
%A Mukherjee, Nilanjan
%A Neerkundar, Vidya
%A Patyra, Marek
%A Rajski, Janusz
%A Tyszer, Jerzy
%A Zawada, Justyna
%B ITC
%D 2015
%I IEEE
%K dblp
%P 1-8
%T Embedded deterministic test points for compact cell-aware tests.
%U http://dblp.uni-trier.de/db/conf/itc/itc2015.html#AceroFHMMNPRTZ15
%@ 978-1-4673-6578-9
@inproceedings{conf/itc/AceroFHMMNPRTZ15,
added-at = {2018-03-02T00:00:00.000+0100},
author = {Acero, Cesar and Feltham, Derek and Hapke, Friedrich and Moghaddam, Elham K. and Mukherjee, Nilanjan and Neerkundar, Vidya and Patyra, Marek and Rajski, Janusz and Tyszer, Jerzy and Zawada, Justyna},
biburl = {https://www.bibsonomy.org/bibtex/27b0c6270c176330512abce02498449a7/dblp},
booktitle = {ITC},
crossref = {conf/itc/2015},
ee = {https://doi.org/10.1109/TEST.2015.7342383},
interhash = {356761b2675052f4eae75980010498e8},
intrahash = {7b0c6270c176330512abce02498449a7},
isbn = {978-1-4673-6578-9},
keywords = {dblp},
pages = {1-8},
publisher = {IEEE},
timestamp = {2018-03-03T11:36:48.000+0100},
title = {Embedded deterministic test points for compact cell-aware tests.},
url = {http://dblp.uni-trier.de/db/conf/itc/itc2015.html#AceroFHMMNPRTZ15},
year = 2015
}