Inproceedings,
Impact of voltage scaling on nanoscale SRAM reliability.
V. Chandra, and R. Aitken.DATE, page 387-392. IEEE, (2009)
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- conf/date/ChandraA09
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- inproceedings
- booktitle
- DATE
- year
- 2009
- pages
- 387-392
- publisher
- IEEE
- crossref
- conf/date/2009
- ee
- http://dl.acm.org/citation.cfm?id=1874713
- isbn
- 978-1-4244-3781-8
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- http://dblp.uni-trier.de/db/conf/date/date2009.html#ChandraA09
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- please select -%0 Conference Paper
%1 conf/date/ChandraA09
%A Chandra, Vikas
%A Aitken, Robert C.
%B DATE
%D 2009
%E Benini, Luca
%E Micheli, Giovanni De
%E Al-Hashimi, Bashir M.
%E Müller, Wolfgang
%I IEEE
%K dblp
%P 387-392
%T Impact of voltage scaling on nanoscale SRAM reliability.
%U http://dblp.uni-trier.de/db/conf/date/date2009.html#ChandraA09
%@ 978-1-4244-3781-8
@inproceedings{conf/date/ChandraA09,
added-at = {2017-05-23T00:00:00.000+0200},
author = {Chandra, Vikas and Aitken, Robert C.},
biburl = {https://www.bibsonomy.org/bibtex/2999fe469c7eda942e6f321c787a0ee62/dblp},
booktitle = {DATE},
crossref = {conf/date/2009},
editor = {Benini, Luca and Micheli, Giovanni De and Al-Hashimi, Bashir M. and Müller, Wolfgang},
ee = {http://dl.acm.org/citation.cfm?id=1874713},
interhash = {359f71255ab6220a7fec8962a277c63e},
intrahash = {999fe469c7eda942e6f321c787a0ee62},
isbn = {978-1-4244-3781-8},
keywords = {dblp},
pages = {387-392},
publisher = {IEEE},
timestamp = {2019-10-17T15:02:11.000+0200},
title = {Impact of voltage scaling on nanoscale SRAM reliability.},
url = {http://dblp.uni-trier.de/db/conf/date/date2009.html#ChandraA09},
year = 2009
}