%0 Journal Article %1 journals/cem/HoqueSB20 %A Hoque, Tamzidul %A SLPSK, Patanjali %A Bhunia, Swarup %D 2020 %J IEEE Consumer Electron. Mag. %K dblp %N 6 %P 72-83 %T Trust Issues in Microelectronics: The Concerns and the Countermeasures. %U http://dblp.uni-trier.de/db/journals/cem/cem9.html#HoqueSB20 %V 9

@article{journals/cem/HoqueSB20, added-at = {2024-05-07T00:00:00.000+0200}, author = {Hoque, Tamzidul and SLPSK, Patanjali and Bhunia, Swarup}, biburl = {https://www.bibsonomy.org/bibtex/216c726081b66cc57c7263a945e1bf117/dblp}, ee = {https://doi.org/10.1109/MCE.2020.2988048}, interhash = {36275f379cd017820b04ac05d6681c00}, intrahash = {16c726081b66cc57c7263a945e1bf117}, journal = {IEEE Consumer Electron. Mag.}, keywords = {dblp}, number = 6, pages = {72-83}, timestamp = {2024-05-13T07:58:09.000+0200}, title = {Trust Issues in Microelectronics: The Concerns and the Countermeasures.}, url = {http://dblp.uni-trier.de/db/journals/cem/cem9.html#HoqueSB20}, volume = 9, year = 2020 }