%0 Conference Paper %1 conf/itc/DandapaniPA84 %A Dandapani, Ramaswami %A Patel, Janak H. %A Abraham, Jacob A. %B ITC %D 1984 %I IEEE Computer Society %K dblp %P 315-319 %T Design of Test Pattern Generators for Built-In Test. %U http://dblp.uni-trier.de/db/conf/itc/itc1984.html#DandapaniPA84

@inproceedings{conf/itc/DandapaniPA84, added-at = {2002-11-22T00:00:00.000+0100}, author = {Dandapani, Ramaswami and Patel, Janak H. and Abraham, Jacob A.}, biburl = {https://www.bibsonomy.org/bibtex/2def15a2f99a5f8d167e7a0d45b6854e9/dblp}, booktitle = {ITC}, crossref = {conf/itc/1984}, date = {2002-11-22}, description = {dblp}, interhash = {378adcad3023f0a90251bb4c05db766a}, intrahash = {def15a2f99a5f8d167e7a0d45b6854e9}, keywords = {dblp}, pages = {315-319}, publisher = {IEEE Computer Society}, timestamp = {2002-11-22T00:00:00.000+0100}, title = {Design of Test Pattern Generators for Built-In Test.}, url = {http://dblp.uni-trier.de/db/conf/itc/itc1984.html#DandapaniPA84}, year = 1984 }