%0 Conference Paper %1 conf/cicc/KosakaNMI07 %A Kosaka, Daisuke %A Nagata, Makoto %A Murasaka, Yoshitaka %A Iwata, Atsushi %B CICC %D 2007 %I IEEE %K dblp %P 849-852 %T Chip-Level Substrate Noise Analysis with Emphasis of Vertical Impurity Profile for Isolation. %U http://dblp.uni-trier.de/db/conf/cicc/cicc2007.html#KosakaNMI07 %@ 978-1-4244-1623-3

@inproceedings{conf/cicc/KosakaNMI07, added-at = {2018-11-30T00:00:00.000+0100}, author = {Kosaka, Daisuke and Nagata, Makoto and Murasaka, Yoshitaka and Iwata, Atsushi}, biburl = {https://www.bibsonomy.org/bibtex/27ff299149ecf5934aa512cf7359b0e7e/dblp}, booktitle = {CICC}, crossref = {conf/cicc/2007}, ee = {https://doi.org/10.1109/CICC.2007.4405861}, interhash = {38c4a47522a930d364e932007b5705aa}, intrahash = {7ff299149ecf5934aa512cf7359b0e7e}, isbn = {978-1-4244-1623-3}, keywords = {dblp}, pages = {849-852}, publisher = {IEEE}, timestamp = {2019-10-17T23:07:16.000+0200}, title = {Chip-Level Substrate Noise Analysis with Emphasis of Vertical Impurity Profile for Isolation.}, url = {http://dblp.uni-trier.de/db/conf/cicc/cicc2007.html#KosakaNMI07}, year = 2007 }