%0 Journal Article %1 journals/qre/ParkPM23 %A Park, You-Jin %A Pan, Rong %A Montgomery, Douglas C. %D 2023 %J Qual. Reliab. Eng. Int. %K dblp %N 1 %P 67-80 %T A novel hybrid resampling for semiconductor wafer defect bin classification. %U http://dblp.uni-trier.de/db/journals/qre/qre39.html#ParkPM23 %V 39

@article{journals/qre/ParkPM23, added-at = {2023-02-25T00:00:00.000+0100}, author = {Park, You-Jin and Pan, Rong and Montgomery, Douglas C.}, biburl = {https://www.bibsonomy.org/bibtex/2df1346ab7f58da25895a8f89a5fdb294/dblp}, ee = {https://doi.org/10.1002/qre.3217}, interhash = {397436294f5cab9954ffc58fd5835e75}, intrahash = {df1346ab7f58da25895a8f89a5fdb294}, journal = {Qual. Reliab. Eng. Int.}, keywords = {dblp}, month = {February}, number = 1, pages = {67-80}, timestamp = {2024-04-08T14:44:24.000+0200}, title = {A novel hybrid resampling for semiconductor wafer defect bin classification.}, url = {http://dblp.uni-trier.de/db/journals/qre/qre39.html#ParkPM23}, volume = 39, year = 2023 }