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Design, assembly and reliability of large die and fine-pitch Cu/low-k flip chip package.
Y. Ong, S. Ho, K. Vaidyanathan, V. Sekhar, M. Jong, S. Long, V. Sheng, L. Wai, V. Rao, J. Ong, X. Ong, X. Zhang, Y. Seung, J. Lau, Y. Lim, D. Yeo, K. Chan, Y. Zhang, J. Tan, and D. Sohn.Microelectron. Reliab., 50 (7): 986-994 (2010)
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- 986-994
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- https://doi.org/10.1016/j.microrel.2010.03.010
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%1 journals/mr/OngHVSJLSWROOZSLLYCYTS10
%A Ong, Yue Ying
%A Ho, Soon Wee
%A Vaidyanathan, Kripesh
%A Sekhar, Vasarla Nagendra
%A Jong, Ming Chinq
%A Long, Samuel Lim Yak
%A Sheng, Vincent Lee Wen
%A Wai, Leong Ching
%A Rao, Vempati Srinivasa
%A Ong, Jimmy
%A Ong, Xuefen
%A Zhang, Xiaowu
%A Seung, Yoon Uk
%A Lau, John H.
%A Lim, Yeow Kheng
%A Yeo, David
%A Chan, Kai Chong
%A Zhang, Yanfeng
%A Tan, Juan Boon
%A Sohn, Dong Kyun
%D 2010
%J Microelectron. Reliab.
%K dblp
%N 7
%P 986-994
%T Design, assembly and reliability of large die and fine-pitch Cu/low-k flip chip package.
%U http://dblp.uni-trier.de/db/journals/mr/mr50.html#OngHVSJLSWROOZSLLYCYTS10
%V 50
@article{journals/mr/OngHVSJLSWROOZSLLYCYTS10,
added-at = {2023-09-27T00:00:00.000+0200},
author = {Ong, Yue Ying and Ho, Soon Wee and Vaidyanathan, Kripesh and Sekhar, Vasarla Nagendra and Jong, Ming Chinq and Long, Samuel Lim Yak and Sheng, Vincent Lee Wen and Wai, Leong Ching and Rao, Vempati Srinivasa and Ong, Jimmy and Ong, Xuefen and Zhang, Xiaowu and Seung, Yoon Uk and Lau, John H. and Lim, Yeow Kheng and Yeo, David and Chan, Kai Chong and Zhang, Yanfeng and Tan, Juan Boon and Sohn, Dong Kyun},
biburl = {https://www.bibsonomy.org/bibtex/297a0883319485b865920f8c837118c9e/dblp},
ee = {https://doi.org/10.1016/j.microrel.2010.03.010},
interhash = {3a576b3521ca612761dd7dc86dfdc72b},
intrahash = {97a0883319485b865920f8c837118c9e},
journal = {Microelectron. Reliab.},
keywords = {dblp},
number = 7,
pages = {986-994},
timestamp = {2024-04-09T02:49:28.000+0200},
title = {Design, assembly and reliability of large die and fine-pitch Cu/low-k flip chip package.},
url = {http://dblp.uni-trier.de/db/journals/mr/mr50.html#OngHVSJLSWROOZSLLYCYTS10},
volume = 50,
year = 2010
}