%0 Conference Paper %1 conf/dac/BaiDR00 %A Bai, Xiaoliang %A Dey, Sujit %A Rajski, Janusz %B DAC %D 2000 %E Micheli, Giovanni De %I ACM %K dblp %P 619-624 %T Self-test methodology for at-speed test of crosstalk in chip interconnects. %U http://dblp.uni-trier.de/db/conf/dac/dac2000.html#BaiDR00

@inproceedings{conf/dac/BaiDR00, added-at = {2017-03-16T00:00:00.000+0100}, author = {Bai, Xiaoliang and Dey, Sujit and Rajski, Janusz}, biburl = {https://www.bibsonomy.org/bibtex/2e559c26440549484d2f9c90eb5d2265b/dblp}, booktitle = {DAC}, crossref = {conf/dac/2000}, editor = {Micheli, Giovanni De}, ee = {http://doi.acm.org/10.1145/337292.337597}, interhash = {3a78765bb41264eb82f93f171f98967c}, intrahash = {e559c26440549484d2f9c90eb5d2265b}, keywords = {dblp}, pages = {619-624}, publisher = {ACM}, timestamp = {2017-03-17T11:38:02.000+0100}, title = {Self-test methodology for at-speed test of crosstalk in chip interconnects.}, url = {http://dblp.uni-trier.de/db/conf/dac/dac2000.html#BaiDR00}, year = 2000 }