%0 Journal Article %1 journals/tvlsi/AghaeePE15 %A Aghaee, Nima %A Peng, Zebo %A Eles, Petru %D 2015 %J IEEE Trans. Very Large Scale Integr. Syst. %K dblp %N 12 %P 2992-3005 %T Temperature-Gradient-Based Burn-In and Test Scheduling for 3-D Stacked ICs. %U http://dblp.uni-trier.de/db/journals/tvlsi/tvlsi23.html#AghaeePE15 %V 23

@article{journals/tvlsi/AghaeePE15, added-at = {2020-03-11T00:00:00.000+0100}, author = {Aghaee, Nima and Peng, Zebo and Eles, Petru}, biburl = {https://www.bibsonomy.org/bibtex/27128d1692bfe2d37ca442962cb36e62f/dblp}, ee = {https://doi.org/10.1109/TVLSI.2014.2380477}, interhash = {3ae1d842061e962047b3740942e441b5}, intrahash = {7128d1692bfe2d37ca442962cb36e62f}, journal = {IEEE Trans. Very Large Scale Integr. Syst.}, keywords = {dblp}, number = 12, pages = {2992-3005}, timestamp = {2020-03-12T11:40:57.000+0100}, title = {Temperature-Gradient-Based Burn-In and Test Scheduling for 3-D Stacked ICs.}, url = {http://dblp.uni-trier.de/db/journals/tvlsi/tvlsi23.html#AghaeePE15}, volume = 23, year = 2015 }