%0 Journal Article %1 journals/mr/HeCPQ12 %A He, Qingchuan %A Chen, Wenhua %A Pan, Jun %A Qian, Ping %D 2012 %J Microelectron. Reliab. %K dblp %N 11 %P 2773-2780 %T Improved step stress accelerated life testing method for electronic product. %U http://dblp.uni-trier.de/db/journals/mr/mr52.html#HeCPQ12 %V 52

@article{journals/mr/HeCPQ12, added-at = {2020-10-26T00:00:00.000+0100}, author = {He, Qingchuan and Chen, Wenhua and Pan, Jun and Qian, Ping}, biburl = {https://www.bibsonomy.org/bibtex/264f150154a3ed709ad4f9567624d12aa/dblp}, ee = {https://doi.org/10.1016/j.microrel.2012.04.003}, interhash = {3b1fceb3f431ba519f3ca6e677f27dbe}, intrahash = {64f150154a3ed709ad4f9567624d12aa}, journal = {Microelectron. Reliab.}, keywords = {dblp}, number = 11, pages = {2773-2780}, timestamp = {2020-10-27T12:44:32.000+0100}, title = {Improved step stress accelerated life testing method for electronic product.}, url = {http://dblp.uni-trier.de/db/journals/mr/mr52.html#HeCPQ12}, volume = 52, year = 2012 }