%0 Conference Paper %1 conf/fpl/ZickLF14 %A Zick, Kenneth M. %A Li, Sen %A French, Matthew %B FPL %D 2014 %I IEEE %K dblp %P 1-6 %T High-precision self-characterization for the LUT burn-in information leakage threat. %U http://dblp.uni-trier.de/db/conf/fpl/fpl2014.html#ZickLF14

@inproceedings{conf/fpl/ZickLF14, added-at = {2017-05-21T00:00:00.000+0200}, author = {Zick, Kenneth M. and Li, Sen and French, Matthew}, biburl = {https://www.bibsonomy.org/bibtex/2ab4b31f80f37e2c741d36cdaf19ecf72/dblp}, booktitle = {FPL}, crossref = {conf/fpl/2014}, ee = {https://doi.org/10.1109/FPL.2014.6927475}, interhash = {3b347db90958d56dac898369733666be}, intrahash = {ab4b31f80f37e2c741d36cdaf19ecf72}, keywords = {dblp}, pages = {1-6}, publisher = {IEEE}, timestamp = {2019-10-17T19:13:37.000+0200}, title = {High-precision self-characterization for the LUT burn-in information leakage threat.}, url = {http://dblp.uni-trier.de/db/conf/fpl/fpl2014.html#ZickLF14}, year = 2014 }