%0 Conference Paper %1 conf/ats/LiuWYEWC18 %A Liu, Peng %A Wu, Jigang %A You, Zhiqiang %A Elimu, Michael %A Wang, Weizheng %A Cai, Shuo %B ATS %D 2018 %I IEEE %K dblp %P 25-29 %T Defect Analysis and Parallel March Test Algorithm for 3D Hybrid CMOS-Memristor Memory. %U http://dblp.uni-trier.de/db/conf/ats/ats2018.html#LiuWYEWC18 %@ 978-1-5386-9466-4

@inproceedings{conf/ats/LiuWYEWC18, added-at = {2023-03-24T00:00:00.000+0100}, author = {Liu, Peng and Wu, Jigang and You, Zhiqiang and Elimu, Michael and Wang, Weizheng and Cai, Shuo}, biburl = {https://www.bibsonomy.org/bibtex/222163e24ef71db826b41d9fd6f6fb8f9/dblp}, booktitle = {ATS}, crossref = {conf/ats/2018}, ee = {https://doi.ieeecomputersociety.org/10.1109/ATS.2018.00016}, interhash = {3e2a5b349410fd428fdfc4f46c5786a9}, intrahash = {22163e24ef71db826b41d9fd6f6fb8f9}, isbn = {978-1-5386-9466-4}, keywords = {dblp}, pages = {25-29}, publisher = {IEEE}, timestamp = {2024-04-10T06:36:39.000+0200}, title = {Defect Analysis and Parallel March Test Algorithm for 3D Hybrid CMOS-Memristor Memory.}, url = {http://dblp.uni-trier.de/db/conf/ats/ats2018.html#LiuWYEWC18}, year = 2018 }