%0 Journal Article %1 journals/tim/ChengWHLHM24 %A Cheng, Jiangtao %A Wen, Guojun %A He, Xin %A Liu, Xingyue %A Hu, Yang %A Mei, Shuang %D 2024 %J IEEE Trans. Instrum. Meas. %K dblp %P 1-12 %T Achieving the Defect Transfer Detection of Semiconductor Wafer by a Novel Prototype Learning-Based Semantic Segmentation Network. %U http://dblp.uni-trier.de/db/journals/tim/tim73.html#ChengWHLHM24 %V 73

@article{journals/tim/ChengWHLHM24, added-at = {2024-01-13T00:00:00.000+0100}, author = {Cheng, Jiangtao and Wen, Guojun and He, Xin and Liu, Xingyue and Hu, Yang and Mei, Shuang}, biburl = {https://www.bibsonomy.org/bibtex/2631bef785e1f0e148ca7273f920bafbe/dblp}, ee = {https://doi.org/10.1109/TIM.2023.3334368}, interhash = {3edc693fec72da614bfe6252791f10f2}, intrahash = {631bef785e1f0e148ca7273f920bafbe}, journal = {IEEE Trans. Instrum. Meas.}, keywords = {dblp}, pages = {1-12}, timestamp = {2024-04-08T14:39:42.000+0200}, title = {Achieving the Defect Transfer Detection of Semiconductor Wafer by a Novel Prototype Learning-Based Semantic Segmentation Network.}, url = {http://dblp.uni-trier.de/db/journals/tim/tim73.html#ChengWHLHM24}, volume = 73, year = 2024 }