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%0 Conference Paper
%1 conf/icecsys/BezniaBAHME12
%A Beznia, Kamel
%A Bounceur, Ahcène
%A Abdallah, Louay
%A Huang, Ke
%A Mir, Salvador
%A Euler, Reinhardt
%B ICECS
%D 2012
%I IEEE
%K dblp
%P 272-275
%T Accurate estimation of analog test metrics with extreme circuits.
%U http://dblp.uni-trier.de/db/conf/icecsys/icecsys2012.html#BezniaBAHME12
%@ 978-1-4673-1259-2
@inproceedings{conf/icecsys/BezniaBAHME12,
added-at = {2017-05-23T00:00:00.000+0200},
author = {Beznia, Kamel and Bounceur, Ahcène and Abdallah, Louay and Huang, Ke and Mir, Salvador and Euler, Reinhardt},
biburl = {https://www.bibsonomy.org/bibtex/21534eebfa1b3b09bbb3e3c67c8fbe1ca/dblp},
booktitle = {ICECS},
crossref = {conf/icecsys/2012},
ee = {https://doi.org/10.1109/ICECS.2012.6463748},
interhash = {3f06037dea48964c208acb4ab1a4b66b},
intrahash = {1534eebfa1b3b09bbb3e3c67c8fbe1ca},
isbn = {978-1-4673-1259-2},
keywords = {dblp},
pages = {272-275},
publisher = {IEEE},
timestamp = {2019-10-17T19:53:27.000+0200},
title = {Accurate estimation of analog test metrics with extreme circuits.},
url = {http://dblp.uni-trier.de/db/conf/icecsys/icecsys2012.html#BezniaBAHME12},
year = 2012
}