%0 Conference Paper %1 conf/itc/PowellCH97 %A Powell, Theo J. %A Cline, Dan %A Hii, Francis %B ITC %D 1997 %I IEEE Computer Society %K dblp %P 200-208 %T A 256Meg SDRAM BIST for Disturb Test Application. %U http://dblp.uni-trier.de/db/conf/itc/itc1997.html#PowellCH97 %@ 0-7803-4209-7

@inproceedings{conf/itc/PowellCH97, added-at = {2023-03-23T00:00:00.000+0100}, author = {Powell, Theo J. and Cline, Dan and Hii, Francis}, biburl = {https://www.bibsonomy.org/bibtex/2753ee398d52c1bdf8d4d9e75e95e43d4/dblp}, booktitle = {ITC}, crossref = {conf/itc/1997}, ee = {https://doi.ieeecomputersociety.org/10.1109/TEST.1997.639614}, interhash = {3f956c761f7a42839873f5f465d75f47}, intrahash = {753ee398d52c1bdf8d4d9e75e95e43d4}, isbn = {0-7803-4209-7}, keywords = {dblp}, pages = {200-208}, publisher = {IEEE Computer Society}, timestamp = {2024-04-10T19:53:11.000+0200}, title = {A 256Meg SDRAM BIST for Disturb Test Application.}, url = {http://dblp.uni-trier.de/db/conf/itc/itc1997.html#PowellCH97}, year = 1997 }