%0 Conference Paper %1 conf/irps/NajmS19 %A Najm, Farid N. %A Sukharev, Valeriy %B IRPS %D 2019 %I IEEE %K dblp %P 1-10 %T Efficient Simulation of Electromigration Damage in Large Chip Power Grids Using Accurate Physical Models (Invited Paper). %U http://dblp.uni-trier.de/db/conf/irps/irps2019.html#NajmS19 %@ 978-1-5386-9504-3

@inproceedings{conf/irps/NajmS19, added-at = {2019-05-31T00:00:00.000+0200}, author = {Najm, Farid N. and Sukharev, Valeriy}, biburl = {https://www.bibsonomy.org/bibtex/233928ee6b0b3f6406c998aa388179a94/dblp}, booktitle = {IRPS}, crossref = {conf/irps/2019}, ee = {https://doi.org/10.1109/IRPS.2019.8720438}, interhash = {3fd69140148ea66ea79d614fcb4e15c6}, intrahash = {33928ee6b0b3f6406c998aa388179a94}, isbn = {978-1-5386-9504-3}, keywords = {dblp}, pages = {1-10}, publisher = {IEEE}, timestamp = {2019-10-17T14:45:22.000+0200}, title = {Efficient Simulation of Electromigration Damage in Large Chip Power Grids Using Accurate Physical Models (Invited Paper).}, url = {http://dblp.uni-trier.de/db/conf/irps/irps2019.html#NajmS19}, year = 2019 }