%0 Conference Paper %1 conf/date/SreedharK09 %A Sreedhar, Aswin %A Kundu, Sandip %B DATE %D 2009 %E Benini, Luca %E Micheli, Giovanni De %E Al-Hashimi, Bashir M. %E Müller, Wolfgang %I IEEE %K dblp %P 381-386 %T On linewidth-based yield analysis for nanometer lithography. %U http://dblp.uni-trier.de/db/conf/date/date2009.html#SreedharK09 %@ 978-1-4244-3781-8

@inproceedings{conf/date/SreedharK09, added-at = {2017-05-23T00:00:00.000+0200}, author = {Sreedhar, Aswin and Kundu, Sandip}, biburl = {https://www.bibsonomy.org/bibtex/2d2ef04b981fe597df04722722a67a4ef/dblp}, booktitle = {DATE}, crossref = {conf/date/2009}, editor = {Benini, Luca and Micheli, Giovanni De and Al-Hashimi, Bashir M. and Müller, Wolfgang}, ee = {http://dl.acm.org/citation.cfm?id=1874712}, interhash = {40284eaa36ea7f7735959bcd60381e1b}, intrahash = {d2ef04b981fe597df04722722a67a4ef}, isbn = {978-1-4244-3781-8}, keywords = {dblp}, pages = {381-386}, publisher = {IEEE}, timestamp = {2019-10-17T15:02:11.000+0200}, title = {On linewidth-based yield analysis for nanometer lithography.}, url = {http://dblp.uni-trier.de/db/conf/date/date2009.html#SreedharK09}, year = 2009 }