%0 Conference Paper %1 conf/irps/HouCCTCCRB22 %A Hou, Lin %A Chery, Emmanuel %A Croes, Kristof %A Tierno, Davide %A Chew, Soon Aik %A Chen, Yangyin %A Rakbin, Peter %A Beyne, Eric %B IRPS %D 2022 %I IEEE %K dblp %P 4 %T Reliability Investigation of W2W Hybrid Bonding Interface: Breakdown Voltage and Leakage Mechanism. %U http://dblp.uni-trier.de/db/conf/irps/irps2022.html#HouCCTCCRB22 %@ 978-1-6654-7950-9

@inproceedings{conf/irps/HouCCTCCRB22, added-at = {2022-05-09T00:00:00.000+0200}, author = {Hou, Lin and Chery, Emmanuel and Croes, Kristof and Tierno, Davide and Chew, Soon Aik and Chen, Yangyin and Rakbin, Peter and Beyne, Eric}, biburl = {https://www.bibsonomy.org/bibtex/2c317f7f07cd83ce8f0e13a7497c5d554/dblp}, booktitle = {IRPS}, crossref = {conf/irps/2022}, ee = {https://doi.org/10.1109/IRPS48227.2022.9764478}, interhash = {405944875a5ef6acf0f900cb947598e8}, intrahash = {c317f7f07cd83ce8f0e13a7497c5d554}, isbn = {978-1-6654-7950-9}, keywords = {dblp}, pages = 4, publisher = {IEEE}, timestamp = {2024-04-09T12:18:58.000+0200}, title = {Reliability Investigation of W2W Hybrid Bonding Interface: Breakdown Voltage and Leakage Mechanism.}, url = {http://dblp.uni-trier.de/db/conf/irps/irps2022.html#HouCCTCCRB22}, year = 2022 }