%0 Journal Article %1 journals/tvlsi/MajumderHUR19 %A Majumder, Md. Badruddoja %A Hasan, Md Sakib %A Uddin, Mesbah %A Rose, Garrett S. %D 2019 %J IEEE Trans. Very Large Scale Integr. Syst. %K dblp %N 2 %P 416-429 %T A Secure Integrity Checking System for Nanoelectronic Resistive RAM. %U http://dblp.uni-trier.de/db/journals/tvlsi/tvlsi27.html#MajumderHUR19 %V 27

@article{journals/tvlsi/MajumderHUR19, added-at = {2022-10-02T00:00:00.000+0200}, author = {Majumder, Md. Badruddoja and Hasan, Md Sakib and Uddin, Mesbah and Rose, Garrett S.}, biburl = {https://www.bibsonomy.org/bibtex/216fb6a9d73c66e5a48637b8a3d1275e8/dblp}, ee = {https://doi.org/10.1109/TVLSI.2018.2876693}, interhash = {4082acf9e5bbab0c945e2c08216012fc}, intrahash = {16fb6a9d73c66e5a48637b8a3d1275e8}, journal = {IEEE Trans. Very Large Scale Integr. Syst.}, keywords = {dblp}, number = 2, pages = {416-429}, timestamp = {2024-04-08T14:32:14.000+0200}, title = {A Secure Integrity Checking System for Nanoelectronic Resistive RAM.}, url = {http://dblp.uni-trier.de/db/journals/tvlsi/tvlsi27.html#MajumderHUR19}, volume = 27, year = 2019 }