%0 Conference Paper %1 conf/micro/NairJE10 %A Nair, Arun A. %A John, Lizy Kurian %A Eeckhout, Lieven %B MICRO %D 2010 %I IEEE Computer Society %K dblp %P 125-136 %T AVF Stressmark: Towards an Automated Methodology for Bounding the Worst-Case Vulnerability to Soft Errors. %U http://dblp.uni-trier.de/db/conf/micro/micro2010.html#NairJE10 %@ 978-0-7695-4299-7

@inproceedings{conf/micro/NairJE10, added-at = {2022-05-31T00:00:00.000+0200}, author = {Nair, Arun A. and John, Lizy Kurian and Eeckhout, Lieven}, biburl = {https://www.bibsonomy.org/bibtex/215c86159bb71c5b1f8f5ec5422eb7a2b/dblp}, booktitle = {MICRO}, crossref = {conf/micro/2010}, ee = {http://dl.acm.org/citation.cfm?id=1935017}, interhash = {416e12644a47a0a008be05fee96a08df}, intrahash = {15c86159bb71c5b1f8f5ec5422eb7a2b}, isbn = {978-0-7695-4299-7}, keywords = {dblp}, pages = {125-136}, publisher = {IEEE Computer Society}, timestamp = {2024-04-09T12:46:32.000+0200}, title = {AVF Stressmark: Towards an Automated Methodology for Bounding the Worst-Case Vulnerability to Soft Errors.}, url = {http://dblp.uni-trier.de/db/conf/micro/micro2010.html#NairJE10}, year = 2010 }