%0 Conference Paper %1 conf/ches/OuahmaMHE17 %A Ouahma, Inès Ben El %A Meunier, Quentin L. %A Heydemann, Karine %A Encrenaz, Emmanuelle %B PROOFS %D 2017 %E Kühne, Ulrich %E Danger, Jean-Luc %E Guilley, Sylvain %I EasyChair %K dblp %P 17-32 %T Symbolic Approach for Side-Channel Resistance Analysis of Masked Assembly Codes. %U http://dblp.uni-trier.de/db/conf/ches/proofs2017.html#OuahmaMHE17 %V 49

@inproceedings{conf/ches/OuahmaMHE17, added-at = {2021-11-30T00:00:00.000+0100}, author = {Ouahma, Inès Ben El and Meunier, Quentin L. and Heydemann, Karine and Encrenaz, Emmanuelle}, biburl = {https://www.bibsonomy.org/bibtex/2f5e937ac74e91831addb5aa7ccac473f/dblp}, booktitle = {PROOFS}, crossref = {conf/ches/2017proofs}, editor = {Kühne, Ulrich and Danger, Jean-Luc and Guilley, Sylvain}, ee = {https://doi.org/10.29007/hhnf}, interhash = {433d1d3e70f393430714bd761466607f}, intrahash = {f5e937ac74e91831addb5aa7ccac473f}, keywords = {dblp}, pages = {17-32}, publisher = {EasyChair}, series = {EPiC Series in Computing}, timestamp = {2024-04-10T01:20:53.000+0200}, title = {Symbolic Approach for Side-Channel Resistance Analysis of Masked Assembly Codes.}, url = {http://dblp.uni-trier.de/db/conf/ches/proofs2017.html#OuahmaMHE17}, volume = 49, year = 2017 }