%0 Conference Paper %1 conf/ats/YamazakiYITS01 %A Yamazaki, Iwao %A Yamanaka, Hiroki %A Ikeda, Toshio %A Takakura, Masahiro %A Sato, Yasuo %B Asian Test Symposium %D 2001 %I IEEE Computer Society %K dblp %P 123- %T An Approach to Improve the Resolution of Defect-Based Diagnosis. %U http://dblp.uni-trier.de/db/conf/ats/ats2001.html#YamazakiYITS01 %@ 0-7695-1378-6

@inproceedings{conf/ats/YamazakiYITS01, added-at = {2023-03-24T00:00:00.000+0100}, author = {Yamazaki, Iwao and Yamanaka, Hiroki and Ikeda, Toshio and Takakura, Masahiro and Sato, Yasuo}, biburl = {https://www.bibsonomy.org/bibtex/2fb10a7ea79f09f1daacdf5c99acf5206/dblp}, booktitle = {Asian Test Symposium}, crossref = {conf/ats/2001}, ee = {https://doi.ieeecomputersociety.org/10.1109/ATS.2001.990270}, interhash = {43da2dd41cce5030825727471fe3794a}, intrahash = {fb10a7ea79f09f1daacdf5c99acf5206}, isbn = {0-7695-1378-6}, keywords = {dblp}, pages = {123-}, publisher = {IEEE Computer Society}, timestamp = {2024-04-10T06:35:48.000+0200}, title = {An Approach to Improve the Resolution of Defect-Based Diagnosis.}, url = {http://dblp.uni-trier.de/db/conf/ats/ats2001.html#YamazakiYITS01}, year = 2001 }