%0 Conference Paper %1 conf/dft/XuH16 %A Xu, Xiaolin %A Holcomb, Daniel E. %B DFT %D 2016 %I IEEE Computer Society %K dblp %P 135-140 %T Reliable PUF design using failure patterns from time-controlled power gating. %U http://dblp.uni-trier.de/db/conf/dft/dft2016.html#XuH16 %@ 978-1-5090-3623-3

@inproceedings{conf/dft/XuH16, added-at = {2023-03-24T00:00:00.000+0100}, author = {Xu, Xiaolin and Holcomb, Daniel E.}, biburl = {https://www.bibsonomy.org/bibtex/28f0babe8d560418924a46d3bda2533f8/dblp}, booktitle = {DFT}, crossref = {conf/dft/2016}, ee = {https://doi.ieeecomputersociety.org/10.1109/DFT.2016.7684085}, interhash = {4423caa87d27c1f869a7b6947084c4dd}, intrahash = {8f0babe8d560418924a46d3bda2533f8}, isbn = {978-1-5090-3623-3}, keywords = {dblp}, pages = {135-140}, publisher = {IEEE Computer Society}, timestamp = {2024-04-10T12:57:09.000+0200}, title = {Reliable PUF design using failure patterns from time-controlled power gating.}, url = {http://dblp.uni-trier.de/db/conf/dft/dft2016.html#XuH16}, year = 2016 }