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%0 Journal Article
%1 journals/mj/VoutilainenPMJ09
%A Voutilainen, Juha-Veikko
%A Putaala, Jussi
%A Moilanen, Markku
%A Jantunen, Heli
%D 2009
%J Microelectron. J.
%K dblp
%N 7
%P 1069-1080
%T A prognostic method for the embedded failure monitoring of solder interconnections with 1149.4 test bus architecture.
%U http://dblp.uni-trier.de/db/journals/mj/mj40.html#VoutilainenPMJ09
%V 40
@article{journals/mj/VoutilainenPMJ09,
added-at = {2020-02-22T00:00:00.000+0100},
author = {Voutilainen, Juha-Veikko and Putaala, Jussi and Moilanen, Markku and Jantunen, Heli},
biburl = {https://www.bibsonomy.org/bibtex/2b88903b47a74882a4185ce74b63ebf77/dblp},
ee = {https://doi.org/10.1016/j.mejo.2007.09.009},
interhash = {45e22a7c712c25ef28d1f569aa13cedf},
intrahash = {b88903b47a74882a4185ce74b63ebf77},
journal = {Microelectron. J.},
keywords = {dblp},
number = 7,
pages = {1069-1080},
timestamp = {2020-02-25T13:01:07.000+0100},
title = {A prognostic method for the embedded failure monitoring of solder interconnections with 1149.4 test bus architecture.},
url = {http://dblp.uni-trier.de/db/journals/mj/mj40.html#VoutilainenPMJ09},
volume = 40,
year = 2009
}