%0 Conference Paper %1 conf/irps/GaoCRSFMMZ23 %A Gao, Zhan %A Chiocchetta, Francesca %A Rampazzo, Fabiana %A Santi, Carlo De %A Fornasier, Mirko %A Meneghesso, Gaudenzio %A Meneghini, Matteo %A Zanoni, Enrico %B IRPS %D 2023 %I IEEE %K dblp %P 1-5 %T Thermally-activated failure mechanisms of 0.25 \ m$ RF AIGaN/GaN HEMTs submitted to long-term life tests. %U http://dblp.uni-trier.de/db/conf/irps/irps2023.html#GaoCRSFMMZ23 %@ 978-1-6654-5672-2

@inproceedings{conf/irps/GaoCRSFMMZ23, added-at = {2024-05-07T00:00:00.000+0200}, author = {Gao, Zhan and Chiocchetta, Francesca and Rampazzo, Fabiana and Santi, Carlo De and Fornasier, Mirko and Meneghesso, Gaudenzio and Meneghini, Matteo and Zanoni, Enrico}, biburl = {https://www.bibsonomy.org/bibtex/270ccbc6411f3b0ddac6ee780ce37b395/dblp}, booktitle = {IRPS}, crossref = {conf/irps/2023}, ee = {https://doi.org/10.1109/IRPS48203.2023.10118131}, interhash = {467d11c62fe71a4fb3e105bb100d8ca3}, intrahash = {70ccbc6411f3b0ddac6ee780ce37b395}, isbn = {978-1-6654-5672-2}, keywords = {dblp}, pages = {1-5}, publisher = {IEEE}, timestamp = {2024-05-13T09:41:11.000+0200}, title = {Thermally-activated failure mechanisms of 0.25 \ \mu \mathrm{m}$ RF AIGaN/GaN HEMTs submitted to long-term life tests.}, url = {http://dblp.uni-trier.de/db/conf/irps/irps2023.html#GaoCRSFMMZ23}, year = 2023 }