%0 Journal Article %1 journals/eswa/LeeYP01 %A Lee, Jang Hee %A You, Sung Jin %A Park, Sang-Chan %D 2001 %J Expert Syst. Appl. %K dblp %N 2 %P 133-151 %T A new intelligent SOFM-based sampling plan for advanced process control. %U http://dblp.uni-trier.de/db/journals/eswa/eswa20.html#LeeYP01 %V 20

@article{journals/eswa/LeeYP01, added-at = {2020-10-26T00:00:00.000+0100}, author = {Lee, Jang Hee and You, Sung Jin and Park, Sang-Chan}, biburl = {https://www.bibsonomy.org/bibtex/23f982385e9b0ba219b5ed0e532605ceb/dblp}, ee = {https://doi.org/10.1016/S0957-4174(00)00054-3}, interhash = {46fcbc0f71ad596f6845bccd84b89c05}, intrahash = {3f982385e9b0ba219b5ed0e532605ceb}, journal = {Expert Syst. Appl.}, keywords = {dblp}, number = 2, pages = {133-151}, timestamp = {2020-10-27T11:38:11.000+0100}, title = {A new intelligent SOFM-based sampling plan for advanced process control.}, url = {http://dblp.uni-trier.de/db/journals/eswa/eswa20.html#LeeYP01}, volume = 20, year = 2001 }