%0 Conference Paper %1 conf/irps/ShirotaYCWWCYAT15 %A Shirota, Riichiro %A Yang, Bo-Jun %A Chiu, Yung-Yueh %A Wu, Yu-Ting %A Wang, Pin-Yao %A Chang, Jung-Ho %A Yano, Masaru %A Aoki, Minoru %A Takeshita, Toshiaki %A Wang, C.-Y. %A Kurachi, Ikuo %B IRPS %D 2015 %I IEEE %K dblp %P 12 %T Improvement of oxide reliability in NAND flash memories using tight endurance cycling with shorter idling period. %U http://dblp.uni-trier.de/db/conf/irps/irps2015.html#ShirotaYCWWCYAT15 %@ 978-1-4673-7362-3

@inproceedings{conf/irps/ShirotaYCWWCYAT15, added-at = {2022-08-05T00:00:00.000+0200}, author = {Shirota, Riichiro and Yang, Bo-Jun and Chiu, Yung-Yueh and Wu, Yu-Ting and Wang, Pin-Yao and Chang, Jung-Ho and Yano, Masaru and Aoki, Minoru and Takeshita, Toshiaki and Wang, C.-Y. and Kurachi, Ikuo}, biburl = {https://www.bibsonomy.org/bibtex/234e08e5edc5e8bfe968e4590ae2b87b5/dblp}, booktitle = {IRPS}, crossref = {conf/irps/2015}, ee = {https://doi.org/10.1109/IRPS.2015.7112814}, interhash = {481c0acf87e35158fe010e16836d4e17}, intrahash = {34e08e5edc5e8bfe968e4590ae2b87b5}, isbn = {978-1-4673-7362-3}, keywords = {dblp}, pages = 12, publisher = {IEEE}, timestamp = {2024-04-10T16:54:51.000+0200}, title = {Improvement of oxide reliability in NAND flash memories using tight endurance cycling with shorter idling period.}, url = {http://dblp.uni-trier.de/db/conf/irps/irps2015.html#ShirotaYCWWCYAT15}, year = 2015 }