%0 Conference Paper %1 conf/dac/GhoshF00 %A Ghosh, Indradeep %A Fujita, Masahiro %B DAC %D 2000 %E Micheli, Giovanni De %I ACM %K dblp %P 43-48 %T Automatic test pattern generation for functional RTL circuits using assignment decision diagrams. %U http://dblp.uni-trier.de/db/conf/dac/dac2000.html#GhoshF00

@inproceedings{conf/dac/GhoshF00, added-at = {2017-03-16T00:00:00.000+0100}, author = {Ghosh, Indradeep and Fujita, Masahiro}, biburl = {https://www.bibsonomy.org/bibtex/2f6960d01d8a42c9e1179c0ec668fd042/dblp}, booktitle = {DAC}, crossref = {conf/dac/2000}, editor = {Micheli, Giovanni De}, ee = {http://doi.acm.org/10.1145/337292.337309}, interhash = {4899bd8c1aea3d1cd89e2acb6701d108}, intrahash = {f6960d01d8a42c9e1179c0ec668fd042}, keywords = {dblp}, pages = {43-48}, publisher = {ACM}, timestamp = {2017-03-17T11:38:02.000+0100}, title = {Automatic test pattern generation for functional RTL circuits using assignment decision diagrams.}, url = {http://dblp.uni-trier.de/db/conf/dac/dac2000.html#GhoshF00}, year = 2000 }