%0 Journal Article %1 journals/integration/KimTCS18 %A Kim, Taeyoung %A Tan, Sheldon X.-D. %A Cook, Chase %A Sun, Zeyu %D 2018 %J Integr. %K dblp %P 31-40 %T Detection of counterfeited ICs via on-chip sensor and post-fabrication authentication policy. %U http://dblp.uni-trier.de/db/journals/integration/integration63.html#KimTCS18 %V 63

@article{journals/integration/KimTCS18, added-at = {2021-02-19T00:00:00.000+0100}, author = {Kim, Taeyoung and Tan, Sheldon X.-D. and Cook, Chase and Sun, Zeyu}, biburl = {https://www.bibsonomy.org/bibtex/2284df4536596c8275f330fe576f02f3a/dblp}, ee = {https://doi.org/10.1016/j.vlsi.2018.05.002}, interhash = {50aa4474addc0ac6038e224f04ab4941}, intrahash = {284df4536596c8275f330fe576f02f3a}, journal = {Integr.}, keywords = {dblp}, pages = {31-40}, timestamp = {2024-04-08T13:15:02.000+0200}, title = {Detection of counterfeited ICs via on-chip sensor and post-fabrication authentication policy.}, url = {http://dblp.uni-trier.de/db/journals/integration/integration63.html#KimTCS18}, volume = 63, year = 2018 }