Пожалуйста, войдите в систему, чтобы принять участие в дискуссии (добавить собственные рецензию, или комментарий)
Цитировать эту публикацию
%0 Conference Paper
%1 conf/essderc/ElmessaryNAGK17
%A Elmessary, Muhammad A.
%A Nagy, Daniel
%A Aldegunde, Manuel
%A García-Loureiro, Antonio J.
%A Kalna, Karol
%B ESSDERC
%D 2017
%I IEEE
%K dblp
%P 184-187
%T Study of strained effects in nanoscale GAA nanowire FETs using 3D Monte Carlo simulations.
%U http://dblp.uni-trier.de/db/conf/essderc/essderc2017.html#ElmessaryNAGK17
%@ 978-1-5090-5978-2
@inproceedings{conf/essderc/ElmessaryNAGK17,
added-at = {2020-09-05T00:00:00.000+0200},
author = {Elmessary, Muhammad A. and Nagy, Daniel and Aldegunde, Manuel and García-Loureiro, Antonio J. and Kalna, Karol},
biburl = {https://www.bibsonomy.org/bibtex/28ab5761632f731151f628cd3bbb43e6a/dblp},
booktitle = {ESSDERC},
crossref = {conf/essderc/2017},
ee = {https://doi.org/10.1109/ESSDERC.2017.8066622},
interhash = {5157e49fe45050fb49aa217cf13b45d2},
intrahash = {8ab5761632f731151f628cd3bbb43e6a},
isbn = {978-1-5090-5978-2},
keywords = {dblp},
pages = {184-187},
publisher = {IEEE},
timestamp = {2020-09-09T14:55:32.000+0200},
title = {Study of strained effects in nanoscale GAA nanowire FETs using 3D Monte Carlo simulations.},
url = {http://dblp.uni-trier.de/db/conf/essderc/essderc2017.html#ElmessaryNAGK17},
year = 2017
}