%0 Conference Paper %1 conf/itc/LeeWA06 %A Lee, Benjamin N. %A Wang, Li-C. %A Abadir, Magdy S. %B ITC %D 2006 %E Davidson, Scott %E Gattiker, Anne %I IEEE Computer Society %K dblp %P 1-10 %T Issues on Test Optimization with Known Good Dies and Known Defective Dies - A Statistical Perspective. %U http://dblp.uni-trier.de/db/conf/itc/itc2006.html#LeeWA06 %@ 1-4244-0292-1

@inproceedings{conf/itc/LeeWA06, added-at = {2017-06-15T00:00:00.000+0200}, author = {Lee, Benjamin N. and Wang, Li-C. and Abadir, Magdy S.}, biburl = {https://www.bibsonomy.org/bibtex/26afabced4a2a8bc8803c3d3ba57a4f4d/dblp}, booktitle = {ITC}, crossref = {conf/itc/2006}, editor = {Davidson, Scott and Gattiker, Anne}, ee = {https://doi.org/10.1109/TEST.2006.297640}, interhash = {51601232f51fab3cebc69114d6aaa092}, intrahash = {6afabced4a2a8bc8803c3d3ba57a4f4d}, isbn = {1-4244-0292-1}, keywords = {dblp}, pages = {1-10}, publisher = {IEEE Computer Society}, timestamp = {2024-04-10T00:23:16.000+0200}, title = {Issues on Test Optimization with Known Good Dies and Known Defective Dies - A Statistical Perspective.}, url = {http://dblp.uni-trier.de/db/conf/itc/itc2006.html#LeeWA06}, year = 2006 }