%0 Conference Paper %1 conf/cicc/HanJSWWCZXDWXPZ17 %A Han, Xiaowei %A Jia, Qian %A Sun, Hongbin %A Wang, Longfei %A Wu, Huaqiang %A Cai, Yimao %A Zhang, Feng %A Xie, Yongyi %A Dong, Fangxu %A Wang, Xiaoguang %A Xue, Xiaofei %A Pang, Li %A Zhao, Xiaoqing %A Wu, Mengnan %A Bai, Pu %A Liu, Qi %A Lv, Hangbing %A Yu, Bing %A Zhao, Chao %A Qian, He %A Huang, Ru %A Liu, Ming %A Zhou, Yumei %A Zheng, Nanning %A Ren, Qiwei %B CICC %D 2017 %I IEEE %K dblp %P 1-4 %T A 0.13μm 64Mb HfOx ReRAM using configurable ramped voltage write and low read-disturb sensing techniques for reliability improvement. %U http://dblp.uni-trier.de/db/conf/cicc/cicc2017.html#HanJSWWCZXDWXPZ17 %@ 978-1-5090-5191-5

@inproceedings{conf/cicc/HanJSWWCZXDWXPZ17, added-at = {2024-06-04T00:00:00.000+0200}, author = {Han, Xiaowei and Jia, Qian and Sun, Hongbin and Wang, Longfei and Wu, Huaqiang and Cai, Yimao and Zhang, Feng and Xie, Yongyi and Dong, Fangxu and Wang, Xiaoguang and Xue, Xiaofei and Pang, Li and Zhao, Xiaoqing and Wu, Mengnan and Bai, Pu and Liu, Qi and Lv, Hangbing and Yu, Bing and Zhao, Chao and Qian, He and Huang, Ru and Liu, Ming and Zhou, Yumei and Zheng, Nanning and Ren, Qiwei}, biburl = {https://www.bibsonomy.org/bibtex/2cd296564402abb10f2bf9f24002f166a/dblp}, booktitle = {CICC}, crossref = {conf/cicc/2017}, ee = {https://doi.org/10.1109/CICC.2017.7993685}, interhash = {5266741e7ea87fe057dab24895f03d9f}, intrahash = {cd296564402abb10f2bf9f24002f166a}, isbn = {978-1-5090-5191-5}, keywords = {dblp}, pages = {1-4}, publisher = {IEEE}, timestamp = {2024-06-10T07:22:45.000+0200}, title = {A 0.13μm 64Mb HfOx ReRAM using configurable ramped voltage write and low read-disturb sensing techniques for reliability improvement.}, url = {http://dblp.uni-trier.de/db/conf/cicc/cicc2017.html#HanJSWWCZXDWXPZ17}, year = 2017 }