%0 Conference Paper %1 conf/irps/UemuraLMMLLSP18 %A Uemura, Taiki %A Lee, Soonyoung %A Min, Dahye %A Moon, Ihlhwa %A Lim, Jungman %A Lee, Seungbae %A Sagong, Hyun-Chul %A Pae, Sangwoo %B IRPS %D 2018 %I IEEE %K dblp %P 1 %T Investigation of alpha-induced single event transient (SET) in 10 nm FinFET logic circuit. %U http://dblp.uni-trier.de/db/conf/irps/irps2018.html#UemuraLMMLLSP18 %@ 978-1-5386-5479-8

@inproceedings{conf/irps/UemuraLMMLLSP18, added-at = {2019-01-22T00:00:00.000+0100}, author = {Uemura, Taiki and Lee, Soonyoung and Min, Dahye and Moon, Ihlhwa and Lim, Jungman and Lee, Seungbae and Sagong, Hyun-Chul and Pae, Sangwoo}, biburl = {https://www.bibsonomy.org/bibtex/2ebcfd8beb68e3017e258c252d1a93a6a/dblp}, booktitle = {IRPS}, crossref = {conf/irps/2018}, ee = {https://doi.org/10.1109/IRPS.2018.8353689}, interhash = {534130bc330ca0b0c0a00193298c7a57}, intrahash = {ebcfd8beb68e3017e258c252d1a93a6a}, isbn = {978-1-5386-5479-8}, keywords = {dblp}, pages = 1, publisher = {IEEE}, timestamp = {2019-10-17T14:45:36.000+0200}, title = {Investigation of alpha-induced single event transient (SET) in 10 nm FinFET logic circuit.}, url = {http://dblp.uni-trier.de/db/conf/irps/irps2018.html#UemuraLMMLLSP18}, year = 2018 }