%0 Journal Article %1 journals/mr/VallabhaneniIMK17 %A Vallabhaneni, Renuka %A Izadi, Ehsan %A Mayer, Carl R. %A Kaira, C. Shashank %A Singh, Sudhanshu S. %A Rajagopalan, Jagannathan %A Chawla, Nikhilesh %D 2017 %J Microelectron. Reliab. %K dblp %P 314-320 %T In situ tensile testing of tin (Sn) whiskers in a focused ion beam (FIB)/scanning electron microscope (SEM). %U http://dblp.uni-trier.de/db/journals/mr/mr79.html#VallabhaneniIMK17 %V 79

@article{journals/mr/VallabhaneniIMK17, added-at = {2022-04-09T00:00:00.000+0200}, author = {Vallabhaneni, Renuka and Izadi, Ehsan and Mayer, Carl R. and Kaira, C. Shashank and Singh, Sudhanshu S. and Rajagopalan, Jagannathan and Chawla, Nikhilesh}, biburl = {https://www.bibsonomy.org/bibtex/284e606b06a382f46b3ba4f0c8be3e389/dblp}, ee = {https://doi.org/10.1016/j.microrel.2017.07.042}, interhash = {539c5cb67eed05322aa9f2594adb2d58}, intrahash = {84e606b06a382f46b3ba4f0c8be3e389}, journal = {Microelectron. Reliab.}, keywords = {dblp}, pages = {314-320}, timestamp = {2024-04-09T02:50:36.000+0200}, title = {In situ tensile testing of tin (Sn) whiskers in a focused ion beam (FIB)/scanning electron microscope (SEM).}, url = {http://dblp.uni-trier.de/db/journals/mr/mr79.html#VallabhaneniIMK17}, volume = 79, year = 2017 }