%0 Conference Paper %1 conf/iscas/El-MalehA03 %A El-Maleh, Aiman H. %A Al-Utaibi, Khaled %B ISCAS (5) %D 2003 %I IEEE %K dblp %P 545-548 %T On efficient extraction of partially specified test sets for synchronous sequential circuits. %U http://dblp.uni-trier.de/db/conf/iscas/iscas2003-5.html#El-MalehA03 %@ 0-7803-7761-3

@inproceedings{conf/iscas/El-MalehA03, added-at = {2016-05-20T00:00:00.000+0200}, author = {El-Maleh, Aiman H. and Al-Utaibi, Khaled}, biburl = {https://www.bibsonomy.org/bibtex/28180b86ef3dfe0912b33a68d58c7098f/dblp}, booktitle = {ISCAS (5)}, crossref = {conf/iscas/2003}, ee = {http://dx.doi.org/10.1109/ISCAS.2003.1206346}, interhash = {5417154a1f787afbed9cd7c66d4fc133}, intrahash = {8180b86ef3dfe0912b33a68d58c7098f}, isbn = {0-7803-7761-3}, keywords = {dblp}, pages = {545-548}, publisher = {IEEE}, timestamp = {2016-05-21T11:45:42.000+0200}, title = {On efficient extraction of partially specified test sets for synchronous sequential circuits.}, url = {http://dblp.uni-trier.de/db/conf/iscas/iscas2003-5.html#El-MalehA03}, year = 2003 }