Bitte melden Sie sich an um selbst Rezensionen oder Kommentare zu erstellen.
Zitieren Sie diese Publikation
Mehr Zitationsstile
- bitte auswählen -
%0 Conference Paper
%1 conf/icicdt/YangCFHSC13
%A Yang, Shao-Yu
%A Chen, Yin-Nien
%A Fan, Ming-Long
%A Hu, Vita Pi-Ho
%A Su, Pin
%A Chuang, Ching-Te
%B ICICDT
%D 2013
%I IEEE
%K dblp
%P 61-64
%T Impacts of single trap induced random telegraph noise on Si and Ge nanowire FETs, 6T SRAM cells and logic circuits.
%U http://dblp.uni-trier.de/db/conf/icicdt/icicdt2013.html#YangCFHSC13
%@ 978-1-4673-4740-2
@inproceedings{conf/icicdt/YangCFHSC13,
added-at = {2018-11-02T00:00:00.000+0100},
author = {Yang, Shao-Yu and Chen, Yin-Nien and Fan, Ming-Long and Hu, Vita Pi-Ho and Su, Pin and Chuang, Ching-Te},
biburl = {https://www.bibsonomy.org/bibtex/28f4cd9d4803bdc2e09051ab8f60da8b1/dblp},
booktitle = {ICICDT},
crossref = {conf/icicdt/2013},
ee = {https://doi.org/10.1109/ICICDT.2013.6563303},
interhash = {5445b1a86ccc27874e8db41fc130fd21},
intrahash = {8f4cd9d4803bdc2e09051ab8f60da8b1},
isbn = {978-1-4673-4740-2},
keywords = {dblp},
pages = {61-64},
publisher = {IEEE},
timestamp = {2018-11-03T16:45:59.000+0100},
title = {Impacts of single trap induced random telegraph noise on Si and Ge nanowire FETs, 6T SRAM cells and logic circuits.},
url = {http://dblp.uni-trier.de/db/conf/icicdt/icicdt2013.html#YangCFHSC13},
year = 2013
}
