%0 Conference Paper %1 conf/itc/McCluskeyB88 %A McCluskey, Edward J. %A Buelow, Fred %B ITC %D 1988 %I IEEE Computer Society %K dblp %P 295-301 %T IC Quality and Test Transparency. %U http://dblp.uni-trier.de/db/conf/itc/itc1988.html#McCluskeyB88 %@ 0-8186-0870-6

@inproceedings{conf/itc/McCluskeyB88, added-at = {2017-05-24T00:00:00.000+0200}, author = {McCluskey, Edward J. and Buelow, Fred}, biburl = {https://www.bibsonomy.org/bibtex/2598ab7eb4ad791b4af14c079b052ba30/dblp}, booktitle = {ITC}, crossref = {conf/itc/1988}, ee = {https://doi.org/10.1109/TEST.1988.207814}, interhash = {5528bcb89e8e975afdb1f10e4df18f89}, intrahash = {598ab7eb4ad791b4af14c079b052ba30}, isbn = {0-8186-0870-6}, keywords = {dblp}, pages = {295-301}, publisher = {IEEE Computer Society}, timestamp = {2019-02-14T11:45:31.000+0100}, title = {IC Quality and Test Transparency.}, url = {http://dblp.uni-trier.de/db/conf/itc/itc1988.html#McCluskeyB88}, year = 1988 }