%0 Journal Article %1 journals/access/LimLS21 %A Lim, Jaehyuk %A Lee, Jinwoong %A Shin, Changhwan %D 2021 %J IEEE Access %K dblp %P 86581-86589 %T Probabilistic Artificial Neural Network for Line-Edge-Roughness-Induced Random Variation in FinFET. %U http://dblp.uni-trier.de/db/journals/access/access9.html#LimLS21 %V 9

@article{journals/access/LimLS21, added-at = {2021-07-13T00:00:00.000+0200}, author = {Lim, Jaehyuk and Lee, Jinwoong and Shin, Changhwan}, biburl = {https://www.bibsonomy.org/bibtex/26bcd844e7e0953b80bc012fae0b66f3e/dblp}, ee = {https://doi.org/10.1109/ACCESS.2021.3088461}, interhash = {55dc4d7ad67b35674df7481a65152d68}, intrahash = {6bcd844e7e0953b80bc012fae0b66f3e}, journal = {IEEE Access}, keywords = {dblp}, pages = {86581-86589}, timestamp = {2024-04-08T13:57:50.000+0200}, title = {Probabilistic Artificial Neural Network for Line-Edge-Roughness-Induced Random Variation in FinFET.}, url = {http://dblp.uni-trier.de/db/journals/access/access9.html#LimLS21}, volume = 9, year = 2021 }