%0 Conference Paper %1 conf/essderc/IoannidisHTPDG14 %A Ioannidis, Eleftherios G. %A Haendler, Sébastien %A Theodorou, Christoforos G. %A Planes, Nicolas %A Dimitriadis, Charalabos A. %A Ghibaudo, Gérard %B ESSDERC %D 2014 %I IEEE %K dblp %P 214-217 %T Statistical analysis of dynamic variability in 28nm FD-SOI MOSFETs. %U http://dblp.uni-trier.de/db/conf/essderc/essderc2014.html#IoannidisHTPDG14 %@ 978-1-4799-4378-4

@inproceedings{conf/essderc/IoannidisHTPDG14, added-at = {2024-10-29T00:00:00.000+0100}, author = {Ioannidis, Eleftherios G. and Haendler, Sébastien and Theodorou, Christoforos G. and Planes, Nicolas and Dimitriadis, Charalabos A. and Ghibaudo, Gérard}, biburl = {https://www.bibsonomy.org/bibtex/2db6e1ea9288ae6c97826712281e6ad73/dblp}, booktitle = {ESSDERC}, crossref = {conf/essderc/2014}, ee = {https://doi.org/10.1109/ESSDERC.2014.6948798}, interhash = {560b6229dde516f05c71df3914b83717}, intrahash = {db6e1ea9288ae6c97826712281e6ad73}, isbn = {978-1-4799-4378-4}, keywords = {dblp}, pages = {214-217}, publisher = {IEEE}, timestamp = {2024-11-04T07:10:15.000+0100}, title = {Statistical analysis of dynamic variability in 28nm FD-SOI MOSFETs.}, url = {http://dblp.uni-trier.de/db/conf/essderc/essderc2014.html#IoannidisHTPDG14}, year = 2014 }