%0 Conference Paper %1 conf/itc/Nigh02 %A Nigh, Phil %B ITC %D 2002 %I IEEE Computer Society %K dblp %P 1198 %T Scan-Based Testing: The Only Practical Solution for Testing ASIC/Consumer Products. %U http://dblp.uni-trier.de/db/conf/itc/itc2002.html#Nigh02 %@ 0-7803-7543-2

@inproceedings{conf/itc/Nigh02, added-at = {2023-03-23T00:00:00.000+0100}, author = {Nigh, Phil}, biburl = {https://www.bibsonomy.org/bibtex/21f1a48e30f669d3bdc4e1a1091ac1f4e/dblp}, booktitle = {ITC}, crossref = {conf/itc/2002}, ee = {https://doi.ieeecomputersociety.org/10.1109/TEST.2002.1041905}, interhash = {5a8e2895f98557efa45c8ef520b9188a}, intrahash = {1f1a48e30f669d3bdc4e1a1091ac1f4e}, isbn = {0-7803-7543-2}, keywords = {dblp}, pages = 1198, publisher = {IEEE Computer Society}, timestamp = {2024-04-10T04:28:16.000+0200}, title = {Scan-Based Testing: The Only Practical Solution for Testing ASIC/Consumer Products.}, url = {http://dblp.uni-trier.de/db/conf/itc/itc2002.html#Nigh02}, year = 2002 }