%0 Conference Paper %1 conf/sigsoft/0003HSZHZ19 %A Chen, Junjie %A Han, Jiaqi %A Sun, Peiyi %A Zhang, Lingming %A Hao, Dan %A Zhang, Lu %B ESEC/SIGSOFT FSE %D 2019 %E Dumas, Marlon %E Pfahl, Dietmar %E Apel, Sven %E Russo, Alessandra %I ACM %K dblp %P 223-234 %T Compiler bug isolation via effective witness test program generation. %U http://dblp.uni-trier.de/db/conf/sigsoft/fse2019.html#0003HSZHZ19 %@ 978-1-4503-5572-8

@inproceedings{conf/sigsoft/0003HSZHZ19, added-at = {2023-03-15T00:00:00.000+0100}, author = {Chen, Junjie and Han, Jiaqi and Sun, Peiyi and Zhang, Lingming and Hao, Dan and Zhang, Lu}, biburl = {https://www.bibsonomy.org/bibtex/2c3c5f29ee6f0c8522d0cd4c6431241ff/dblp}, booktitle = {ESEC/SIGSOFT FSE}, crossref = {conf/sigsoft/2019}, editor = {Dumas, Marlon and Pfahl, Dietmar and Apel, Sven and Russo, Alessandra}, ee = {https://doi.org/10.1145/3338906.3338957}, interhash = {5c76577c1e48c7a6c3dd1aa455db0925}, intrahash = {c3c5f29ee6f0c8522d0cd4c6431241ff}, isbn = {978-1-4503-5572-8}, keywords = {dblp}, pages = {223-234}, publisher = {ACM}, timestamp = {2024-04-09T17:51:31.000+0200}, title = {Compiler bug isolation via effective witness test program generation.}, url = {http://dblp.uni-trier.de/db/conf/sigsoft/fse2019.html#0003HSZHZ19}, year = 2019 }