%0 Journal Article %1 journals/mr/MahdaviM09 %A Mahdavi, Seyyed Javad Seyyed %A Mohammadi, Karim %D 2009 %J Microelectron. Reliab. %K dblp %N 2 %P 199-208 %T Evolutionary derivation of optimal test sets for neural network based analog and mixed signal circuits fault diagnosis approach. %U http://dblp.uni-trier.de/db/journals/mr/mr49.html#MahdaviM09 %V 49

@article{journals/mr/MahdaviM09, added-at = {2020-02-22T00:00:00.000+0100}, author = {Mahdavi, Seyyed Javad Seyyed and Mohammadi, Karim}, biburl = {https://www.bibsonomy.org/bibtex/2547171c4c3b1ac06c35e8cd6c9ed8a2f/dblp}, ee = {https://doi.org/10.1016/j.microrel.2008.12.002}, interhash = {5ceeeaf715ddf3264cde1f2d895f2391}, intrahash = {547171c4c3b1ac06c35e8cd6c9ed8a2f}, journal = {Microelectron. Reliab.}, keywords = {dblp}, number = 2, pages = {199-208}, timestamp = {2020-02-25T13:25:44.000+0100}, title = {Evolutionary derivation of optimal test sets for neural network based analog and mixed signal circuits fault diagnosis approach.}, url = {http://dblp.uni-trier.de/db/journals/mr/mr49.html#MahdaviM09}, volume = 49, year = 2009 }