%0 Conference Paper %1 conf/iolts/GerakisKH15 %A Gerakis, Vasileios %A Katselas, Leonidas %A Hatzopoulos, Alkis A. %B IOLTS %D 2015 %I IEEE %K dblp %P 30-31 %T Fault modeling and testing of through silicon via interconnections. %U http://dblp.uni-trier.de/db/conf/iolts/iolts2015.html#GerakisKH15 %@ 978-1-4673-7905-2

@inproceedings{conf/iolts/GerakisKH15, added-at = {2015-09-04T00:00:00.000+0200}, author = {Gerakis, Vasileios and Katselas, Leonidas and Hatzopoulos, Alkis A.}, biburl = {https://www.bibsonomy.org/bibtex/27bd7543d7d85b3cdf886297ca05d9f8b/dblp}, booktitle = {IOLTS}, crossref = {conf/iolts/2015}, ee = {http://dx.doi.org/10.1109/IOLTS.2015.7229824}, interhash = {5f2cfbe80bdfdf77657fa57d3c4d2b93}, intrahash = {7bd7543d7d85b3cdf886297ca05d9f8b}, isbn = {978-1-4673-7905-2}, keywords = {dblp}, pages = {30-31}, publisher = {IEEE}, timestamp = {2015-09-05T11:33:59.000+0200}, title = {Fault modeling and testing of through silicon via interconnections.}, url = {http://dblp.uni-trier.de/db/conf/iolts/iolts2015.html#GerakisKH15}, year = 2015 }