%0 Journal Article %1 journals/mr/LuCLCWHH11 %A Lu, Chun-Chang %A Chang-Liao, Kuei-Shu %A Lu, Chun-Yuan %A Chang, Shih-Cheng %A Wang, Tien-Ko %A Hou, Fu-Chung %A Hsu, Yao-Tung %D 2011 %J Microelectron. Reliab. %K dblp %N 12 %P 2110-2114 %T Tunneling component suppression in charge pumping measurement and reliability study for high-k gated MOSFETs. %U http://dblp.uni-trier.de/db/journals/mr/mr51.html#LuCLCWHH11 %V 51

@article{journals/mr/LuCLCWHH11, added-at = {2020-02-22T00:00:00.000+0100}, author = {Lu, Chun-Chang and Chang-Liao, Kuei-Shu and Lu, Chun-Yuan and Chang, Shih-Cheng and Wang, Tien-Ko and Hou, Fu-Chung and Hsu, Yao-Tung}, biburl = {https://www.bibsonomy.org/bibtex/2217ef9bb553cb2da823548e379a30445/dblp}, ee = {https://doi.org/10.1016/j.microrel.2011.04.021}, interhash = {5fba05f96b907995ddf92ccb630337aa}, intrahash = {217ef9bb553cb2da823548e379a30445}, journal = {Microelectron. Reliab.}, keywords = {dblp}, number = 12, pages = {2110-2114}, timestamp = {2020-02-25T13:26:15.000+0100}, title = {Tunneling component suppression in charge pumping measurement and reliability study for high-k gated MOSFETs.}, url = {http://dblp.uni-trier.de/db/journals/mr/mr51.html#LuCLCWHH11}, volume = 51, year = 2011 }