%0 Conference Paper %1 conf/vlsi-dat/TsaiLCY13 %A Tsai, Yun-Chih %A Li, Tai-Hung %A Chen, Tai-Chen %A Yeh, Chung-Wei %B VLSI-DAT %D 2013 %I IEEE %K dblp %P 1-4 %T Electromigration- and obstacle-avoiding routing tree construction. %U http://dblp.uni-trier.de/db/conf/vlsi-dat/vlsi-dat2013.html#TsaiLCY13 %@ 978-1-4673-4435-7

@inproceedings{conf/vlsi-dat/TsaiLCY13, added-at = {2015-09-28T00:00:00.000+0200}, author = {Tsai, Yun-Chih and Li, Tai-Hung and Chen, Tai-Chen and Yeh, Chung-Wei}, biburl = {https://www.bibsonomy.org/bibtex/2a724dfcf1a1eb458072638cca855ae47/dblp}, booktitle = {VLSI-DAT}, crossref = {conf/vlsi-dat/2013}, ee = {http://dx.doi.org/10.1109/VLDI-DAT.2013.6533887}, interhash = {608d8b2204f1411d93cb77d41838c717}, intrahash = {a724dfcf1a1eb458072638cca855ae47}, isbn = {978-1-4673-4435-7}, keywords = {dblp}, pages = {1-4}, publisher = {IEEE}, timestamp = {2015-09-29T11:36:18.000+0200}, title = {Electromigration- and obstacle-avoiding routing tree construction.}, url = {http://dblp.uni-trier.de/db/conf/vlsi-dat/vlsi-dat2013.html#TsaiLCY13}, year = 2013 }