%0 Conference Paper %1 conf/wacv/HaikPCK20 %A Haik, Oren %A Perry, Oded %A Chen, Eli %A Klammer, Peter %B WACV %D 2020 %I IEEE %K dblp %P 3530-3539 %T A Novel Inspection System For Variable Data Printing Using Deep Learning. %U http://dblp.uni-trier.de/db/conf/wacv/wacv2020.html#HaikPCK20 %@ 978-1-7281-6553-0

@inproceedings{conf/wacv/HaikPCK20, added-at = {2020-05-18T00:00:00.000+0200}, author = {Haik, Oren and Perry, Oded and Chen, Eli and Klammer, Peter}, biburl = {https://www.bibsonomy.org/bibtex/22bf08283f28176161d4a24ba94c3d0b2/dblp}, booktitle = {WACV}, crossref = {conf/wacv/2020}, ee = {https://doi.org/10.1109/WACV45572.2020.9093396}, interhash = {60b02145e20f76d5af26778dfaa25502}, intrahash = {2bf08283f28176161d4a24ba94c3d0b2}, isbn = {978-1-7281-6553-0}, keywords = {dblp}, pages = {3530-3539}, publisher = {IEEE}, timestamp = {2020-05-19T12:32:54.000+0200}, title = {A Novel Inspection System For Variable Data Printing Using Deep Learning.}, url = {http://dblp.uni-trier.de/db/conf/wacv/wacv2020.html#HaikPCK20}, year = 2020 }